AA3000 Scanning Probe Microscope

Introduction

AA3000 Scanning Probe Microscope is a very popular model. This unit is tailored towards research and industry applications, where the user can perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 Scanning Probe Microscope is capable of performing contact mode, tapping mode, lateral force microscopy and scanning tunneling microscopy. The standard unit is equipped to view sample areas up to 10 micron by 10 micron. The system can be customized to measure larger areas. With a Digital Signal Processor (DSP) TMS320C642 inside the systems, AA3000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA3000 SPM system.

Features

High Performance

• Atomic-scale of resolution

• Large sample size

• DSP(Digital Signal Processing) for great performance

• Real time operating system embedded

• Fast Ethernet connection with computer

Multi-Function

• Atomic Force Microscope (AFM)

• Lateral Force Microscope (LFM)

• Force Analysis: I-V Curve, I-Z Curve, Force Curve

• Online real-time 3D image for better observation

• Multi-channel signals for more sample details

• Trace-Retrace scan, Back-Forward scan

• Multi-Analysis: Granularity and Roughness

• Data load-out for further analysis

Easy Operation

• Fast automatically tip-engaging

• Easy change of the tip holder, for simple switching between STM and AFM

• Full digital control, auto system status recognition

• Software-based sample movement

• Nano-Movie function: Continuous data collection, storage and replay

• Modularized design for convenient maintenance and future upgrades